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CONTACT REGIONAL SITE Select Regional Site Global Site Americas Asia Australia Belgium China France Germany Italy India Japan Korea Malaysia Mexico Middle East Sweden The Netherlands U.K. PRODUCTS APPLICATIONS NOTES SUPPORT ABOUT US PRODUCTS Transmission Electron Microscopes Transmission Electron Microscope (TEM) Scanning Electron Microscopes Scanning Electron Microscope (SEM) Ion Beam Application Equipment Specimen Preparation Equipment MultiBeam System (SEM-FIB) Instruments for Microarea and Surface Analysis Electron Probe Microanalyzer (EPMA) Auger Microprobe (Auger) Photoelectron Spectrometer (ESCA) Magnetic Resonance Equipment Nuclear Magnetic Resonance Spectrometer (NMR) Electron Spin Resonance Spectrometer (ESR) X-ray Fluorescence Spectrometers X-ray Fluorescence Spectrometer (XRF) Mass Spectrometers (MS) GC-MS、Gas Analysis MS LC-MS(DART-MS)、MALDI-TOFMS Semiconductor Equipment Electron Beam Lithography System (EB) 3D Printer Electron Beam Metal AM Machine Industrial Equipment for thin-film formation and material processing Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.) Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.) Clinical Chemistry Analyzers Clinical Chemistry Analyzer (CA) APPLICATIONS NOTES Basic Research Chemistry Automobile Chemicals Glass, Ceramics, Cement Education Battery, Energy Semiconductor and Electronic Parts Rubber, Plastic Medicine, Life Environment, Asbestos Food Metal Search By Product Group About Us About Us Social Activities Initiatives for the SDGs Environment Activities Open Innovation News Investor Relations Event / Exhibition PRODUCTS Transmission Electron Microscopes Transmission Electron Microscope (TEM) Magnetic Resonance Equipment Nuclear Magnetic Resonance Spectrometer (NMR) Electron Spin Resonance Spectrometer (ESR) Semiconductor Equipment Electron Beam Lithography System (EB) Scanning Electron Microscopes Scanning Electron Microscope (SEM) 3D Printer Electron Beam Metal AM Machine Ion Beam Application Equipment Specimen Preparation Equipment MultiBeam System (SEM-FIB) X-ray Fluorescence Spectrometers X-ray Fluorescence Spectrometer (XRF) Industrial Equipment for thin-film formation and material processing Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.) Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.) Instruments for Microarea and Surface Analysis Electron Probe Microanalyzer (EPMA) Auger Microprobe (Auger) Photoelectron Spectrometer (ESCA) Mass Spectrometers GC-MS、Gas Analysis MS LC-MS(DART-MS)、MALDI-TOFMS Clinical Chemistry Analyzers Clinical Chemistry Analyzer (CA) APPLICATIONS NOTES Basic Research Education Medicine, Life Chemistry Battery, Energy Environment, Asbestos Automobile Semiconductor And Electronic Parts Food Chemicals Rubber, Plastic Glass, Ceramics, Cement Metal Search By Product Group SUPPORT ABOUT US About Us Environment Activities Investor Relations Social Activities Open Innovation Initiatives for the SDGs Event / Exhibition News Electron Beam Metal AM Machine JAM-5200EBM High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha" "CRYO ARM™ 300 II" JEM-3300 Field Emission Cryo-Electron Microscope JEM-ARM300F2 GRAND ARM™2 A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages. URUSHI Note About Natural Lacquer: "Urushi Chemistry" Features and Application Examples of Various Instrumental Analysis Methods: TEM/SEM/XPS/ESR/NMR/MS/FT-IR Analysis of Urushiol Components: "Monomer Analysis" Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation" Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis" Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis" Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis" APPLICATIONS NOTE JEOL, a world-leading high-end scientific instruments manufacture, provides a wealth of applications and technical information so that these solutions support our customers rapidly and optimally. 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NEWS 2021/03/31 Our paper has been published in "Communication Materials" 2021/03/26 One term has been added to the Glossary of SEM Terms (Figures have been added). 2021/03/26 The movie of Webinar "Newly Developed GC/MS Qualitative Analysis Solution" is now available. 2021/03/26 JAM-5200EBM Electron Beam Metal AM Machine 2021/03/26 Release of Electron Beam Metal AM Machine "JAM-5200EBM" -Enables mass production of parts of high quality and reproducibility- News Index Seminar / Webinar 2021/03/05 A New Platform for GC-MS Analysis of Complex Samples Event Date: 3/16(Tue) 2021/02/17 Newly Developed GC/MS Qualitative Analysis Solution -Introduction of the latest GC/HR-TOFMS system and It's applications- Event Date: 3/23(Tue) 2021/01/27 Analysis of Pesticides in Honey, Spinach, and Kale using Triple Quad GC-MS/MS Event Date: 2/9(Tue) 2021/01/21 Introduction to Quantitative NMR —Easy and Reliable Assay— Event Date: 2/24(Wed) 2021/01/19 Discovering the Sparkle - Advanced Materials Techniques Event Date: 1/26(Tue) Seminar / Webinar Index Glossary of TEM Terms Glossary of SEM Terms Event / Exhibition YouTube Facebook Twitter @JEOL_Japan Social Media accounts PRODUCTS PRODUCTS TOP New Products Products lineup Catalogue Download Supply Interview Featured users Development secrets Glossary of TEM Terms Glossary of SEM Terms APPLICATIONS NOTES APPLICATIONS NOTE TOP JEOL NEWS YOKOGUSHI Applications of Discontinued Products Introduction to JEOL Products Amazing Nano World SUPPORT Request Product INFO ABOUT US ABOUT US TOP About Us Environment Activities Investor Relations Social Activities Open Innovation Initiatives for the SDGs Event / Exhibition Movies from Past JEOL Webinars Seminar / Webinar Privacy Statement Terms Of Use Social Media Policy Sitemap Copyright © 1996-2021 All Rights Reserved....